MAHR MarSurf Conturograph

MAHR MarSurf Conturograph
Tip
lotnr. 19
Sluitingstijd: 24-09-24 14:18
2,900 € Huidige hoogste bod
1 bod 10 kijkers
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MAHR MarSurf Conturograph
24-09-24 14:18
Sluitingstijd
2,900 €
Huidige hoogste bod
Naam
MAHR MarSurf Conturograph
Artikelnummer
945935
Fabrikant
MAHR
Model / Type
MarSurf
Bouwjaar
2007
Item beschikbaar vanaf
immediately
Toestand item
Locatie
Duitsland, 72189 Vöhringen
opgeld
18 %
Kosten demontage & laden (binding)
500.00 €
Eindtotaal
excl. btw
Transportkosten
niet inclusief
Leveringsvoorwaarden
FCA Vöhringen, verlading op vrachtwagen
Betalingsvoorwaarden
100% vooruitbetaling voor afhaling
instelmaat ca. (l x b x h)
1,600 x 800 x 1,200 mm
gewicht ca.
200 kg
  • Measuring station MarSurf XC 2
  • including midrange standard control,
  • XC 2 software, Mahr License Key
  • MarWin PC
  • Monitor TFT 24
  • Manual control panel MCP 23
  • Feed unit CD 120
  • Measuring stand ST-500
  • with HG plate 700 mm x 550 mm
  • Fixture PCV / CD 120
  • XY table CT 120
  • Rotary adjustment for CT 120
  • Calibration set contour standard
  • Parallel vice PPS
Technical data
  • Hard stone panel 700 mm x 550 mm (L x W) with three
  • 10 mm wide T-slots
  • Measuring column with electrically adjustable height adjustment range
  • of 500 mm* for the feed unit
  • Easy to change holders
  • The measuring stand contains a manual mechanical
  • angle adjustment for the feed unit
  • ST750 = 750 mm
  • Scanning range (in X) 0.2 mm to 120 mm
  • Measuring range (in Z) 50 mm with 350 mm probe arm
  • 25 mm with 175 mm probe arm
  • Measuring system (in X) High-precision incremental measuring system
  • (factory calibration with laser interferometer)
  • Measuring system (in Z) Inductive transducer with high accuracy and linearity
  • linearity
  • Resolution (in Z) in relation to probe tip 0.38 μm with 350 mm probe arm
  • probe arm
  • 0.19 μm with 175 mm probe arm
  • Resolution (in Z) in relation to the measuring system 0.04 μm
  • Guide deviation 1 μm (over 120 mm)
  • Measuring direction (in X) forwards (+X), backwards (-X)
  • Probing direction (in Z) downwards (-Z), upwards (+Z)
  • Measuring force (in Z) 1 mN to 120 mN, downwards and upwards
  • (adjustable in MarSurf XC 2)
  • Scanning angle on smooth surfaces depending on deflection:
  • falling edges up to 88°, rising edges up to 77°
  • Measuring speed (in X) 0.2 mm / s to 4 mm / s
  • Probing speed (in Z) 0.1 mm / s to 1 mm / s
  • Positioning speed (in X)
  • and return speed 0.2 mm / s to 8 mm / s
  • Positioning speed (in Z) 0.2 mm / s to 10 mm / s
  • Probe arm length 175 mm, 350 mm
  • Probe tip radius 25 μm
Vertaling tonen
Automatische vertaling
Veilingnaam
Machines and Inventory for Metalworking
lotnr.
19
Documenten
Specifieke veilingvoorwaarden
Inspectie
De exacte locatie is beschikbaar op aanvraag.
No fixed date.

Viewing by appointment only! Please contact us in advance at lqu@surplex.com for an inspection appointment.
Ophalen
Maandag, 30-09-2024 tot
Donderdag, 03-10-2024, van 08:00 Uur tot 16:00 Uur


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